High-precision non-contact depth measuring microscope
HISOMET-II:DH2
HISOMET realizes non-contact, high-precision height/depth measurement with simple operation, observing the surface of measuring point.

HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it's possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule.
Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.

Specifications
Name
Descriptions
Binocular
Trinocular
Main Body
Base part having built-in power supply for reflecting & transmitted illumination
Yes
Yes
Bracket
Precise focus unit with reflecting illuminator: fine and coarse adjustable bracket, lamp cable (for EL-38)
Yes
Yes
Erected Binocular
With C-Mount, No eyepiece
Yes
Erected Trinocular
With C-Mount, No eyepiece
Yes
X,Y Stage
505S
50X50mm travel, Stage glass, Stage Plate(option)
To be selected
505L
50X50mm travel (with T-grooves), Stage glass
To be selected
510
100X50mm travel (with T-grooves), Stage glass
To be selected
510D
100X50mm travel (with T-grooves), Stage glass, Linear Scale,
2 Axis Counter 1m reading (option)
To be selected
100D
100X100mm travel, Stage glass, Linear Scale, 2 Axis Counter 1m reading (option)
Stage Plate (option)
To be selected
Eyepiece NWF 10X
Field Number f16,with G-14M reticle
Yes
Yes
Eyepiece NWF 10X
Field Number f16
Yes
Objectives
PLM,PLLWDM,SPLM series
  To be selected
Z-axis indicator
1m Reading,25mm Travel
Yes
Yes
Options
Z-axis indicator(0.1m Reading),Photographic system,TV system,etc.
To be selected
TOP